DocumentCode
1824259
Title
Thick silicon strip detector Compton imager
Author
Wulf, Eric A. ; Phlips, Bernard F. ; Johnson, W. Neil ; Kurfess, James D. ; Novikova, Elena I.
Author_Institution
Naval Res. Lab., Washington, DC, USA
Volume
3
fYear
2003
fDate
19-25 Oct. 2003
Firstpage
1699
Abstract
We present initial results obtained with double-sided, thick (2 mm) silicon strip detectors used as a Compton imager. A reconstructed image of a gamma ray source and a spectrum of the gamma ray energy are produced at room temperature using the multiple Compton technique. Multiple Compton interactions allow the energy and Compton scattering angle to be reconstructed without having to absorb the energy of the incident gamma ray completely. This extends our work on multiple Compton imagers using germanium strip detectors to silicon detectors that operate at higher temperatures. The detectors are 57 × 57 mm in active area and are 2 mm thick with 64 strips per side with a pitch of 0.9 mm. The energy resolution of the detectors for 60 keV gamma rays are 3-4 keV at room temperature and 2.1 keV at -20°C. Simulations of the imager are performed in GEANT4, including Doppler broadening, and show agreement with the real data.
Keywords
Compton effect; Doppler broadening; gamma-ray production; germanium radiation detectors; image sensors; radioactive sources; silicon radiation detectors; telescopes; -20 degC; 0.9 mm; 2 mm; 2.1 keV; 20 to 25 degC; 3 to 4 keV; 57 mm; 60 keV; Compton imager; Compton scattering; Doppler broadening; GEANT4; detectors energy resolution; double-sided thick silicon strip detector; gamma ray energy spectrum; gamma ray source; germanium strip detectors; imager simulations; incident gamma ray; multiple Compton imagers; multiple Compton interactions; multiple Compton technique; reconstructed image; room temperature; Energy resolution; Gamma ray detection; Gamma ray detectors; Gamma rays; Germanium; Image reconstruction; Scattering; Silicon; Strips; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2003 IEEE
ISSN
1082-3654
Print_ISBN
0-7803-8257-9
Type
conf
DOI
10.1109/NSSMIC.2003.1352206
Filename
1352206
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