Title :
System-level ESD on-chip protection for mobile display driver IC
Author :
Ko, Jae-Hyok ; Kim, Kwan-Young ; Jeon, Jong-Sung ; Jeon, Chan-Hee ; Kim, Chang-Su ; Lee, Ki-Tae ; Kim, Han-Gu
Author_Institution :
Samsung Electron. Co., Ltd., Yongin, South Korea
Abstract :
System level ESD protection methodology for mobile display driver IC is discussed at the viewpoint of hard and soft failure caused by injected ESD charge into I/O pins from LCD panel. The key design factor was analyzed through device simulation, successfully implemented to IC and verified at system level ESD evaluation.
Keywords :
driver circuits; electrostatic discharge; integrated circuit design; liquid crystal displays; ESD protection methodology; I-O pin; LCD panel; hard failure; injected ESD charge; mobile display driver IC; soft failure; system-level ESD on-chip protection; Couplings; Electrostatic discharge; Integrated circuits; Logic gates; Mobile communication; Stress; Transistors;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location :
Anaheim, CA
Electronic_ISBN :
Pending
