DocumentCode
1824516
Title
ESD system level characterization and modeling methods applied to a LIN transceiver
Author
Besse, P. ; Lafon, F. ; Monnereau, N. ; Caignet, F. ; Laine, J.P. ; Salles, A. ; Rigour, S. ; Bafleur, M. ; Nolhier, N. ; Trémouilles, D.
Author_Institution
Freescale Semicond., Toulouse, France
fYear
2011
fDate
11-16 Sept. 2011
Firstpage
1
Lastpage
9
Abstract
Addressing system level ESD issues requires several types of technical know-how. A collaborative effort, bringing together a research laboratory, a semiconductor supplier and an Equipment Manufacturer (EM), has been initiated to study common and effective solutions to system level ESD problems. In this paper, a generic PCB for the ESD/EMC injection and measurement is presented.
Keywords
electromagnetic compatibility; electrostatic discharge; printed circuits; transceivers; EM; ESD system level characterization; ESD-EMC injection; LIN transceiver; PCB; collaborative effort; equipment manufacturer; modeling methods; research laboratory; semiconductor supplier; Capacitors; Current measurement; Electrostatic discharge; Hidden Markov models; Integrated circuit modeling; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location
Anaheim, CA
ISSN
Pending
Electronic_ISBN
Pending
Type
conf
Filename
6045609
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