• DocumentCode
    1824529
  • Title

    Colorectal MRI image registration using phase mutual information from non-parametric probability density function estimator

  • Author

    Zhang, Weiwei ; Joshi, Niranjan ; Brady, Michael

  • Author_Institution
    Dept. of Eng. Sci., Univ. of Oxford, Oxford
  • fYear
    2008
  • fDate
    14-17 May 2008
  • Firstpage
    1103
  • Lastpage
    1106
  • Abstract
    We propose a nonrigid registration algorithm and apply it to align pre- and post-chemotherapy colorectal MRI images. The algorithm combines feature-based and intensity-based image registration methods. We use local phase, as computed by monogenic signal, as the feature descriptor, and as the similarity measure in the registration algorithm, phase mutual information, which is estimated using NP windows, a non-parametric probability density function (PDF) estimator. Local deformations are modeled using the polyaffine transformation, which guarantees a smooth and invertible warping toward high image resolution. The algorithm is implemented in an adaptive manner, which makes the registration efficient and reliable. We show encouraging preliminary results and will include a performance evaluation on fives of cases in the final paper.
  • Keywords
    biomedical MRI; image registration; image resolution; medical image processing; colorectal MRI; feature descriptor; image registration; image resolution; invertible warping; local deformations; monogenic signal; nonparametric probability density function estimator; nonrigid registration algorithm; phase mutual information; polyaffine transformation; Cancer; Cathode ray tubes; Density measurement; Image registration; Magnetic resonance imaging; Mutual information; Phase estimation; Phase measurement; Probability density function; Tumors; Colorectal Image; Local Phase; Mutual Information; Nonrigid Registration; Polyaffine Transformation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-2002-5
  • Electronic_ISBN
    978-1-4244-2003-2
  • Type

    conf

  • DOI
    10.1109/ISBI.2008.4541193
  • Filename
    4541193