DocumentCode :
1824576
Title :
A Study of Chip Fixture Characterization Using Varactors
Author :
Lane, Richard Q.
Author_Institution :
California Eastern Labs., 3260 Jay St., Santa Clara, CA 95054
Volume :
8
fYear :
1985
fDate :
Dec. 1985
Firstpage :
135
Lastpage :
144
Abstract :
For every frequency there exists an optimum diode mean capacity, ¿(CminCmax). To cover 2-18GHz in .5GHz steps would ideally need 33 diode transfer standards. This is clearly impractical but perhaps 4 diode chips having mean Cj´s in a 1:2:4:8 ratio would be practical.
Keywords :
Capacitance; Capacitors; Fixtures; Frequency measurement; Q measurement; Radio frequency; Reflection; Scattering parameters; Semiconductor device measurement; Varactors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ARFTG Conference Digest-Winter, 26th ARFTG
Conference_Location :
Ontario, Canada
Print_ISBN :
0-7803-5686-1
Type :
conf
DOI :
10.1109/ARFTG.1985.323643
Filename :
4119054
Link To Document :
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