DocumentCode
1824590
Title
Investigating the probability of susceptibility failure within ESD system level consideration
Author
Monnereau, Nicolas ; Caignet, Fabrice ; Nolhier, Nicolas ; Trémouilles, David ; Bafleur, Marise
Author_Institution
LAAS, CNRS, Toulouse, France
fYear
2011
fDate
11-16 Sept. 2011
Firstpage
1
Lastpage
6
Abstract
Estimating failure in ESD system level consideration has become a major concern. The paper proposes a simple case to investigate the susceptibility of latch devices. Simulations and measurements are compared. Analytical formulations to determine the probability of susceptibility failure are proposed and compared with measurements.
Keywords
electrostatic discharge; flip-flops; integrated circuit reliability; ESD system level consideration; electrostatic discharge; failure estimation; latch devices; susceptibility failure; Capacitance; Capacitors; Clocks; Electrostatic discharge; Flip-flops; Integrated circuit modeling; Synchronization;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location
Anaheim, CA
ISSN
Pending
Electronic_ISBN
Pending
Type
conf
Filename
6045611
Link To Document