Title :
Improved Millimeter Waveguide Flanges Improve VANA Performance
Author :
Maury, Mario A., Jr. ; Simpson, Gary R.
Author_Institution :
Maury Microwave Corporation, Cucamonga, CA
Abstract :
Present millimeter waveguide flanges are major limitation when making precision measurements, or when attempting to build precision devices. New waveguide flange designs for all of the MMW bands which will mate with existing flanges but offer much improved performance are presented. This includes both rectangular and double ridged waveguide. Data showing the improvement is included. Flanges on existing equipment may be upgraded for improved performance.
Keywords :
Apertures; Fasteners; Flanges; Indexing; Millimeter wave devices; Millimeter wave measurements; Pins; Rough surfaces; Surface fitting; Surface roughness;
Conference_Titel :
ARFTG Conference Digest-Winter, 26th ARFTG
Conference_Location :
Ontario, Canada
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1985.323644
