Title :
Instrument Test Cables Extend Measuring Ports of HP8510 VNA
Author :
Schwartz, Raymond S. ; Pescatore, Roy J.
Author_Institution :
Adams-Russell Company, Inc., Amesbury, Massachusetts
Keywords :
Assembly; Cables; Capacitive sensors; Degradation; Gold; Insertion loss; Instruments; Manufacturing; Stability criteria; Testing;
Conference_Titel :
ARFTG Conference Digest-Winter, 26th ARFTG
Conference_Location :
Ontario, Canada
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1985.323646
