Title :
Two new unexplained and unresolved HBM tester related failures
Author :
Ward, Scott ; Burgess, Keith ; Kunz, Hans ; Duvvury, Charvaka ; Schichl, Joe ; Rost, Tim
Author_Institution :
Texas Instrum., Dallas, TX, USA
Abstract :
Two new unexplained HBM tester related failures are introduced. Sufficient data has been collected to conclude these failures to be tester related, examples where the tester is not producing reproducible results. One failure is due to stressing multiple samples in parallel and the second is cumulative pulse-related.
Keywords :
electrostatic discharge; failure analysis; test equipment; ESD qualification; containment solution; cumulative pulse-related; failures; unresolved HBM tester; EPROM; Electrostatic discharge; Fixtures; Pins; Sockets; Stress; Voltage measurement;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location :
Anaheim, CA
Electronic_ISBN :
Pending
