DocumentCode
1824728
Title
Filter models of CDM measurement channels and TLP device transients
Author
Maloney, Timothy J. ; Daniel, Abishai
Author_Institution
Intel Corp., Santa Clara, CA, USA
fYear
2011
fDate
11-16 Sept. 2011
Firstpage
1
Lastpage
9
Abstract
Charged Device Model (CDM) waveforms are fast enough to be altered considerably by the oscilloscope used. Step response of CDM measurement channels allow time-domain finite impulse response (FIR) filters to be formulated in software. Similar analytic methods allow filter-like representation of devices as measured by transmission-line pulsing (TLP).
Keywords
FIR filters; oscilloscopes; CDM measurement channels; TLP device transients; charged device model measurement channels; charged device model waveforms; filter models; filter-like representation; oscilloscope; time-domain FIR filters; time-domain finite impulse response filter; transmission-line pulsing device transient; Convolution; Filtering theory; Finite impulse response filter; Generators; IIR filters; Oscilloscopes; Transmission line measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location
Anaheim, CA
ISSN
Pending
Electronic_ISBN
Pending
Type
conf
Filename
6045616
Link To Document