Title :
Electron bunching in stepped electric-field profiles
Author :
Barroso, Joaquim J.
Author_Institution :
Assoc. Plasma Lab., Nat. Inst. for Space Res., São José dos Campos, Brazil
Abstract :
On the basis of analytical considerations and numerical simulation, this work demonstrates that transit-time tubes with stepped RF electric-field profiles can provide electron conversion efficiency in excess of 40 percent. This represents a two-fold enhancement in the conversion efficiency in comparison with that obtained with a longitudinally uniform electric-field distribution. Such an improvement arises from a phase synchronization process due to the action of RF electric fields of reversed signs along the interaction space.
Keywords :
electric fields; microwave tubes; numerical analysis; particle beam bunching; synchronisation; electron bunching; longitudinally uniform electric-field distribution; numerical simulation; phase synchronization process; stepped RF electric-field profiles; transit-time microwave tubes; two-fold enhancement; Cavity resonators; Electric fields; Electron tubes; Force; Plasmas; Radio frequency; Trajectory; conversion efficiency; electron bunching; microwave generation; transit-time microwave tubes;
Conference_Titel :
Vacuum Electronics Conference, IEEE International
Conference_Location :
Monterey, CA
DOI :
10.1109/IVEC.2014.6857644
