Study on dielectric behavior of nano-Ag/polyacrylamide

Author

Feng, Junqiang ; Li, Na ; Cao, Xiaolong

Author_Institution

Power Equip. & Electr. Insulation Nat. Key Lab., Xi´´an Jiaotong Univ., China

Volume

3

fYear

2003

fDate

1-5 June 2003

Firstpage

1130

Abstract

Nano-Ag/polyacrylamide (PAM) composite can be prepared through radiation polymerization. The structure of the composite is determined by XRD and TEM. The composite is powdered to 45 μm and then mixed with EVA evenly. The resistivity (ρ_v), and breakdown electric-field intensity (E_b) of this kind of EVA compound substance is measured at room temperature and at cryogenic temperature. The abnormal dielectric behavior of nano-Ag/PAM composite is discussed. The result shows that the resistivity and electric strength of EVA are improved apparently by adding nano-Ag.

Keywords

X-ray diffraction; dielectric materials; electric breakdown; electric strength; electrical resistivity; materials preparation; nanocomposites; nanoparticles; polymers; silver; transmission electron microscopy; 293 to 298 K; 45 micron; Ag; TEM; XRD; breakdown electric field intensity; cryogenic temperature; dielectric properties; electric strength; electrical resistivity; nanoAg/polyacrylamide composite; powder; radiation polymerization; room temperature; Circuits; Conductivity; Cryogenics; Current supplies; Dielectrics and electrical insulation; Electrons; Electrostatics; Polymers; Temperature measurement; Tunneling;

fLanguage

English

Publisher

ieee

Conference_Titel

Properties and Applications of Dielectric Materials, 2003. Proceedings of the 7th International Conference on

ISSN

1081-7735

Print_ISBN

0-7803-7725-7

Type

conf

DOI

10.1109/ICPADM.2003.1218622

Filename

1218622