DocumentCode :
1824883
Title :
Niobium as new material for electrolyte capacitors with nanoscale dielectric oxide layers
Author :
Fischer, V. ; Störmer, H. ; Gerthsen, D. ; Stenzel, M. ; Zillgen, H. ; Ivers-Tiffée, E.
Author_Institution :
Inst. fur Werkstoffkunde der Elektrotech., Karlsruhe Univ., Germany
Volume :
3
fYear :
2003
fDate :
1-5 June 2003
Firstpage :
1134
Abstract :
New niobium electrolyte capacitors were produced on the base of newly developed capacitorgrade niobium metal powder. To gain a comprehensive understanding of the reactions taking place during the fabrication process which comprises several anodic oxidation and thermal treatment steps, the influence of heat treatments on the electrical and structural properties of the nanoscale dielectric niobium pentoxide layers was investigated. Capacitance measurements at fixed frequency were used to examine the electrical properties of the dielectric oxide layers directly after oxidation steps and heat treatments. Thermogravimetric analysis was applied to characterize the behavior of oxidized niobium anodes during the thermal annealing processes. Scanning electron and high-resolution transmission electron microscopy was performed in order to determine the thickness and microstructure of the nanoscale dielectric niobium pentoxide layers. In the following, the first results of these characterizations will be presented.
Keywords :
annealing; capacitance measurement; crystal microstructure; electrolytic capacitors; heat treatment; nanostructured materials; nanotechnology; niobium compounds; scanning electron microscopy; thermal analysis; transmission electron microscopy; Nb2O5; anodic oxidation; capacitance measurement; capacitorgrade niobium metal powder; electrical properties; heat treatment; high resolution transmission electron microscopy; microstructure; nanoscale dielectric niobium pentoxide layer; nanoscale dielectric oxide layer; niobium; niobium electrolyte capacitor; oxidized niobium anode; scanning electron microscopy; structural properties; thermal annealing; thermal treatment; thermogravimetric analysis; Capacitance measurement; Capacitors; Dielectric materials; Electrons; Fabrication; Heat treatment; Niobium compounds; Oxidation; Powders; Resistance heating;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 2003. Proceedings of the 7th International Conference on
ISSN :
1081-7735
Print_ISBN :
0-7803-7725-7
Type :
conf
DOI :
10.1109/ICPADM.2003.1218623
Filename :
1218623
Link To Document :
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