DocumentCode :
1824907
Title :
An integrated T and TCUSUM scheme
Author :
Qu, L.
Author_Institution :
Sch. of Mech. & Aerosp. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2010
fDate :
7-10 Dec. 2010
Firstpage :
1411
Lastpage :
1415
Abstract :
This article proposes an integrated scheme (T&TCUSUM chart) which combines a Shewhart T chart and a TCUSUM chart (a CUSUM-type T chart) to monitor the time interval T between the occurrences of an event or the time between events (TBE). The performance studies show that the T&TCUSUM chart can effectively improve the overall performance over the entire T shift range. On average, it is more effective than the T chart by 26.66% and the TCUSUM chart by 14.12%. Moreover, the T&TCUSUM chart performs more uniformly than other charts for detecting both small and large T shifts, because it has the strength of both the T chart (more sensitive to large shifts) and the TCUSUM chart (more sensitive to small shifts). The implementation of the new chart is almost as easy as the operation of a TCUSUM chart.
Keywords :
control charts; quality control; statistical process control; Shewhart T chart; T chart; T shift range; TCUSUM chart; integrated T-TCUSUM scheme; time between events; time interval monitoring; Control charts; Exponential distribution; Frequency control; Monitoring; Process control; Quality control; Reliability engineering; CUSUM chart; Quality control; average loss; control chart; statistical process control; steady-state ATS; time between events;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
Conference_Location :
Macao
ISSN :
2157-3611
Print_ISBN :
978-1-4244-8501-7
Electronic_ISBN :
2157-3611
Type :
conf
DOI :
10.1109/IEEM.2010.5674351
Filename :
5674351
Link To Document :
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