Title :
New RF Test Methods Using Waveform Synthesis from Digital Data
Author :
Kuhn, Nicholas J.
Author_Institution :
Hewlett-Packard Co. Inc., Palo Alto, CA
Keywords :
Automatic testing; Binary phase shift keying; Demodulation; Phase distortion; Phase shift keying; RF signals; Radio frequency; Signal synthesis; Synthesizers; System testing;
Conference_Titel :
ARFTG Conference Digest-Spring, 27th ARFTG
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-5686-1
DOI :
10.1109/ARFTG.1986.323664
