• DocumentCode
    1824973
  • Title

    Measurement systems for the analysis of distortions caused by the passage band signals through nonlinear devices

  • Author

    Voronin, N.N. ; Abramenko, Aleksandr Y. ; Goshin, G.G. ; Vasiliev, Andrey S.

  • Author_Institution
    Tomsk State Univ. of Control Syst. & Radioelectron., Tomsk, Russia
  • fYear
    2013
  • fDate
    1-5 July 2013
  • Firstpage
    92
  • Lastpage
    95
  • Abstract
    The work on creation a measurement system is represented. It allows analyzing the distortions arising in the passing band signals through nonlinear devices. The experimental data obtained for the two types of probe signals are given. Prospects of development of the complex and the software for it are announced.
  • Keywords
    distortion measurement; measurement systems; distortion analysis; measurement systems; nonlinear devices; passage band signals; Distortion measurement; Frequency measurement; Nonlinear distortion; Probes; Signal generators; Vectors; Band signal; Fourier transform; amplifier; vector signal generator;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro/Nanotechnologies and Electron Devices (EDM), 2013 14th International Conference of Young Specialists on
  • Conference_Location
    Novosibirsk
  • ISSN
    2325-4173
  • Print_ISBN
    978-1-4799-0761-8
  • Type

    conf

  • DOI
    10.1109/EDM.2013.6641950
  • Filename
    6641950
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1824973