Abstract :
The following topics are dealt with: CMOS protection; smart power technology; RF circuits; ESD analysis techniques; MEMS; integrated circuit packaging; integrated circuit reliability; system level testing; ESD electronic design automation; CDM device testers; TLP device testers; and HBM device testers.
Keywords :
CMOS integrated circuits; electronic design automation; electrostatic discharge; integrated circuit packaging; integrated circuit reliability; micromechanical devices; microwave circuits; test equipment; CDM device testers; CMOS protection; ESD analysis techniques; ESD electronic design automation; HBM device testers; MEMS; RF circuits; TLP device testers; integrated circuit packaging; integrated circuit reliability; smart power technology; system level testing;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd
Conference_Location :
Anaheim, CA
Electronic_ISBN :
Pending
