DocumentCode
1825132
Title
Calculation of multiple sets of weights for weighted random testing
Author
Bershteyn, Michael
Author_Institution
Mitsubishi Electric Res. Lab., Inc., Sunnyvale, CA, USA
fYear
1993
fDate
17-21 Oct 1993
Firstpage
1031
Lastpage
1040
Abstract
Two novel algorithms are presented for calculation of input weights used during weighted random testing. One of them is based on circuit structure analysis, the other one uses pre-generated test patterns to compute weights. These methods provide random tests with high fault coverage and a small number of test vectors. They can be used both for BIST and for external testing of VLSI
Keywords
VLSI; built-in self test; fault diagnosis; integrated circuit testing; integrated logic circuits; logic testing; random processes; BIST; fault coverage; input weights; linear feedback shift register; pregenerated test patterns; weighted random testing; Built-in self-test; Circuit analysis; Circuit analysis computing; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Laboratories; Pattern analysis; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1993. Proceedings., International
Conference_Location
Baltimore, MD
Print_ISBN
0-7803-1430-1
Type
conf
DOI
10.1109/TEST.1993.470595
Filename
470595
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