Title :
Calculation of multiple sets of weights for weighted random testing
Author :
Bershteyn, Michael
Author_Institution :
Mitsubishi Electric Res. Lab., Inc., Sunnyvale, CA, USA
Abstract :
Two novel algorithms are presented for calculation of input weights used during weighted random testing. One of them is based on circuit structure analysis, the other one uses pre-generated test patterns to compute weights. These methods provide random tests with high fault coverage and a small number of test vectors. They can be used both for BIST and for external testing of VLSI
Keywords :
VLSI; built-in self test; fault diagnosis; integrated circuit testing; integrated logic circuits; logic testing; random processes; BIST; fault coverage; input weights; linear feedback shift register; pregenerated test patterns; weighted random testing; Built-in self-test; Circuit analysis; Circuit analysis computing; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Laboratories; Pattern analysis; Very large scale integration;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470595
