DocumentCode
1825222
Title
On selecting flip-flops for partial reset
Author
Abramovici, Miron ; Parikh, Prashant S. ; Mathew, Ben ; Saab, Daniel G.
Author_Institution
AT&T Bell Lab., Naperville, IL, USA
fYear
1993
fDate
17-21 Oct 1993
Firstpage
1008
Lastpage
1012
Abstract
Partial reset is an inexpensive design for test technique in which an additional primary input is connected to the reset or the set inputs of a subset of flip-flops (FFs). In this paper, we present a new method to select the FFs to be initialized and their initial values. The FFs are selected based on their contribution to the testability of the circuit. A sensitivity analysis is done to determine the ranking of FFs. The results obtained by the new method show that our selection of FFs gives consistently better fault coverage than the previously used one
Keywords
circuit analysis computing; design for testability; fault diagnosis; fault location; flip-flops; logic testing; sensitivity analysis; cost function; flip-flops; partial reset; sensitivity analysis; testability; Circuit faults; Circuit testing; Delay; Design for testability; Flip-flops; Hardware; Pins; Routing; Sequential analysis; Sequential circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1993. Proceedings., International
Conference_Location
Baltimore, MD
Print_ISBN
0-7803-1430-1
Type
conf
DOI
10.1109/TEST.1993.470598
Filename
470598
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