Title :
Investigation of LaBr3:Ce and LaCl3:Ce scintillators for spect imaging
Author :
Alzimami, K.S. ; Spyrou, N.M. ; Sassi, S.A.
Author_Institution :
Dept. of Phys., Univ. of Surrey, Guildford
Abstract :
This study aims to investigate the potential use of LaBr3:Ce and LaCl3:Ce materials in SPECT imaging. GATE Monte Carlo simulations of single-head gamma camera and a 99Tcm point source were performed to evaluate the energy spectra, modulation transfer function (MTF) and detection efficiency. A range of Ce concentrations (0.5, 5, 10 and 15)% of LaBr3:Ce and LaCl3:Ce crystals was simulated in conjunction with efficiency calculation to find optimal concentration for SPECT imaging. The MTF curves showed the excellent MTF performance of LaCl3 and LaBr3 particularly at low frequencies. The intrinsic efficiency results demonstrated the superiority of LaBr3:Ce crystals with respect to LaCl3:Ce and Nal(Tl). Results also suggest that higher Ce concentrations for both LaBr3:Ce and LaCl3:Ce crystals only slightly improve intrinsic efficiency. In conclusion, because LaCl3:Ce and LaBr3:Ce combine excellent MTF performance with increased intrinsic efficiency, they have the potential to replace Nal(Tl) as the scintillators of choice for SPECT.
Keywords :
Monte Carlo methods; cerium; chemical variables measurement; gamma-ray apparatus; lanthanum compounds; optical transfer function; single photon emission computed tomography; solid scintillation detectors; technetium; GATE Monte Carlo simulations; LaBr3:Ce; LaCl3:Ce; MTF curves; SPECT imaging; cerium concentration; crystal scintillators; energy spectra; modulation transfer function performance; single photon emission computed tomography imaging; single-head gamma camera; Cameras; Collimators; Crystalline materials; Crystals; Energy resolution; Gamma ray detection; High-resolution imaging; Optical imaging; Single photon emission computed tomography; Spatial resolution; GATE; LaBr3:Ce; LaCl3:Ce; SPECT;
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-2002-5
Electronic_ISBN :
978-1-4244-2003-2
DOI :
10.1109/ISBI.2008.4541228