Title :
Knowledge based testing
Author :
Kumar, Himanshu ; Erjavic, Scott
Author_Institution :
VLSI Technol., Inc., San Jose, CA, USA
Abstract :
As competitive pressures have intensified in the manufacturing of integrated circuits, so too have the needs for innovative solutions to such issues as efficiency and improvement. It is no longer a luxury to enhance efficiency and reduce cost of testing, which by various measures has become the dominant element of IC manufacturing cost. Rather, these have become necessities. There have been some efforts in introducing knowledge based expert systems to semiconductor fabrication operations, but very little has been done to include component assembly and test. A methodology is described for implementing a knowledge based expert system into a semiconductor wafer soft and test operation. Some of the advantages include reduced overhead, manpower and test cost
Keywords :
automatic testing; diagnostic expert systems; economics; integrated circuit manufacture; integrated circuit testing; knowledge based systems; production testing; IC manufacturing cost; cost of testing; efficiency; integrated circuits; knowledge based expert systems; manpower; reduced overhead; semiconductor fabrication; semiconductor wafer; test cost; Circuit testing; Costs; Expert systems; Fabrication; Integrated circuit manufacture; Integrated circuit measurements; Integrated circuit testing; Semiconductor device manufacture; Semiconductor device testing; System testing;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470609
