Title :
Analysis of dynamic effects of resistive bridging faults in CMOS and BiCMOS digital ICs
Author :
Favalli, Michele ; Dalpasso, Marcello ; Olivo, Piero ; Ricco, Bruno
Author_Institution :
DEIS, Bologna Univ., Italy
Abstract :
This paper presents a study of the dynamic behavior of CMOS and BiCMOS digital circuits induced by bridging faults, whose resistance value is shown to have a strong impact on the dynamic behavior of faulty gates and of their fan-out gates. The problem of fault detection is addressed considering delay fault testing and results are compared with those achieved by means of functional testing. Electrical simulation has been used to investigate the main differences between BiCMOS and CMOS circuits. It is shown that, because of the large driving capability of BJTs, the detection as delay faults of bridging faults in BiCMOS circuits is more difficult than in the CMOS case
Keywords :
BiCMOS digital integrated circuits; CMOS integrated circuits; delays; fault diagnosis; fault location; logic testing; BiCMOS digital ICs; CMOS; bridging faults; delay fault testing; delay faults; digital circuits; dynamic behavior; dynamic effects; electrical simulation; fan-out gates; fault detection; functional testing; resistive bridging faults; Added delay; BiCMOS integrated circuits; CMOS digital integrated circuits; CMOS logic circuits; Circuit faults; Circuit simulation; Circuit testing; Electrical fault detection; Fault detection; Semiconductor device modeling;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470614
