Innovative measurement technique for characterizing electro-optical components

Author

Pettai, A. ; Ganwani, A. ; Standen, A. ; Yeou-Song Lee

Author_Institution

Anritsu Co., Morgan Hill, CA, USA

fYear

2002

fDate

5-6 Dec. 2002

Firstpage

81

Lastpage

84

Abstract

Anritsu has developed a technique for its family of Lightning Vector Network Analyzers (VNA) to enable the measurement of domain-transfer devices such as optical modulators, integrated transmitters, photodiodes and photo-receivers. The technique facilitates the measurement of electrical to optical (E/O) and optical to electrical (O/E) transfer function in terms of bandwidth, flatness and phase linearity (group delay) and, with frequency coverage to 65 GHz, is ideally suited for characterizing devices used in 2.5, 10 and 40 Gb/s transmission systems.

Keywords

electro-optical devices; network analysers; optical modulation; optical variables measurement; photodiodes; 10 Gbit/s; 2.5 Gbit/s; 40 Gbit/s; 65 GHz; E/O; O/E; VNA; domain-transfer device; electrical to optical transfer function; electro-optical component; group delay; integrated transmitter; lightning vector network analyzer; optical modulator; optical to electrical transfer function; phase linearity; photodiode; photoreceiver; transmission system; Electric variables measurement; Frequency measurement; Integrated optics; Lightning; Measurement techniques; Optical devices; Optical fiber networks; Optical modulation; Optical transmitters; Photodiodes;

fLanguage

English

Publisher

ieee

Conference_Titel

ARFTG Conference Digest, Fall 2002. 60th

Conference_Location

Washington, DC, USA

Print_ISBN

0-7803-8124-6

Type

conf

DOI

10.1109/ARFTGF.2002.1218689

Filename

1218689