Title :
Innovative measurement technique for characterizing electro-optical components
Author :
Pettai, A. ; Ganwani, A. ; Standen, A. ; Yeou-Song Lee
Author_Institution :
Anritsu Co., Morgan Hill, CA, USA
Abstract :
Anritsu has developed a technique for its family of Lightning Vector Network Analyzers (VNA) to enable the measurement of domain-transfer devices such as optical modulators, integrated transmitters, photodiodes and photo-receivers. The technique facilitates the measurement of electrical to optical (E/O) and optical to electrical (O/E) transfer function in terms of bandwidth, flatness and phase linearity (group delay) and, with frequency coverage to 65 GHz, is ideally suited for characterizing devices used in 2.5, 10 and 40 Gb/s transmission systems.
Keywords :
electro-optical devices; network analysers; optical modulation; optical variables measurement; photodiodes; 10 Gbit/s; 2.5 Gbit/s; 40 Gbit/s; 65 GHz; E/O; O/E; VNA; domain-transfer device; electrical to optical transfer function; electro-optical component; group delay; integrated transmitter; lightning vector network analyzer; optical modulator; optical to electrical transfer function; phase linearity; photodiode; photoreceiver; transmission system; Electric variables measurement; Frequency measurement; Integrated optics; Lightning; Measurement techniques; Optical devices; Optical fiber networks; Optical modulation; Optical transmitters; Photodiodes;
Conference_Titel :
ARFTG Conference Digest, Fall 2002. 60th
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-8124-6
DOI :
10.1109/ARFTGF.2002.1218689
