Fault location algorithms for repairable embedded RAMs

Author

Treuer, Robert P. ; Agarwal, Vinod K.

Author_Institution

Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada

fYear

1993

fDate

17-21 Oct 1993

Firstpage

825

Lastpage

834

Abstract

This paper shows how to: (1) convert single-bit march tests into multi-bit March tests; and then (2) how to transform the new multi-bit March tests, using a "serial shifting notation" which represents "serial access" in embedded RAMs, into serial-access word-oriented March tests. The standard March test notation is extended to compactly include Galloping read actions, and other algorithms with two levels of FOR-loops, since such algorithms are indispensible for locating coupling faults in cell arrays, and stuck-open faults in address decoders. The main body of the paper uses the new notations to describe seven categories of fault location algorithms, with each algorithm displayed in both the "hybrid serial/parallel" and the "modular" data accessing formats

Keywords

automatic testing; fault diagnosis; fault location; integrated circuit testing; integrated memory circuits; logic testing; random-access storage; Galloping read actions; address decoders; cell arrays; coupling faults; hybrid serial/parallel data access; modular data access format; multi-bit March tests; repairable embedded RAMs; serial shifting notation; serial-access word-oriented March tests; single-bit march tests; standard March test notation; stuck-open faults; Built-in self-test; Circuit faults; Circuit testing; Decoding; Fault detection; Fault location; Microelectronics; Random access memory; Read-write memory; Sequential analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1993. Proceedings., International

Conference_Location

Baltimore, MD

Print_ISBN

0-7803-1430-1

Type

conf

DOI

10.1109/TEST.1993.470619

Filename

470619