Title :
Identifying error-box parameters from the twelve-term vector network analyzer error model
Author :
Vandenberghe, S. ; Schreurs, D. ; Carchon, G. ; Nauwelaers, B. ; De Raedt, W.
Author_Institution :
K.U. Leuven ESAT TELEMIC, Leuven, Belgium
Abstract :
Two models describing the systematic measurement error in a two port vector network analyzer are in use. Conditions relating the twelve E-term error model and physically based eight S-term error box model are derived. Three practical E- to S-term conversion algorithms are presented. An example VNA test set is analyzed as to allow for measurement interpretation. Reported results show the limitations of each algorithm.
Keywords :
error analysis; microwave measurement; network analysers; two-port networks; E-term conversion algorithm; S-term conversion algorithm; S-term error box model; error-box parameter; systematic measurement error; vector network analyzer error model; Calibration; Couplers; Crosstalk; Error analysis; Impedance; Measurement errors; Radio frequency; Scattering parameters;
Conference_Titel :
ARFTG Conference Digest, Fall 2002. 60th
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-8124-6
DOI :
10.1109/ARFTGF.2002.1218697