• DocumentCode
    1825995
  • Title

    Identifying error-box parameters from the twelve-term vector network analyzer error model

  • Author

    Vandenberghe, S. ; Schreurs, D. ; Carchon, G. ; Nauwelaers, B. ; De Raedt, W.

  • Author_Institution
    K.U. Leuven ESAT TELEMIC, Leuven, Belgium
  • fYear
    2002
  • fDate
    5-6 Dec. 2002
  • Firstpage
    157
  • Lastpage
    165
  • Abstract
    Two models describing the systematic measurement error in a two port vector network analyzer are in use. Conditions relating the twelve E-term error model and physically based eight S-term error box model are derived. Three practical E- to S-term conversion algorithms are presented. An example VNA test set is analyzed as to allow for measurement interpretation. Reported results show the limitations of each algorithm.
  • Keywords
    error analysis; microwave measurement; network analysers; two-port networks; E-term conversion algorithm; S-term conversion algorithm; S-term error box model; error-box parameter; systematic measurement error; vector network analyzer error model; Calibration; Couplers; Crosstalk; Error analysis; Impedance; Measurement errors; Radio frequency; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ARFTG Conference Digest, Fall 2002. 60th
  • Conference_Location
    Washington, DC, USA
  • Print_ISBN
    0-7803-8124-6
  • Type

    conf

  • DOI
    10.1109/ARFTGF.2002.1218697
  • Filename
    1218697