Title :
Testability features of the SuperSPARC microprocessor
Author :
Patel, Rajiv ; Yarlagadda, Krishna
Author_Institution :
Sun Microsyst. Inc., Mountain View, CA, USA
Abstract :
The Texas Instruments SuperSPARC is a high performance BiCMOS superscalar microprocessor containing 3.1 M transistors. This paper describes the testability features of this highly integrated processor aiming towards achieving a highly manufacturable design. Many of the features described can also be used to test the chip in a system environment. The discussion also includes test pattern generation methods and tools used in generating the test vectors. Pitfalls and benefits of the techniques used have been summarized in the final section
Keywords :
BiCMOS integrated circuits; Texas Instruments computers; design for testability; microprocessor chips; production testing; BiCMOS superscalar microprocessor; SuperSPARC microprocessor; TI computers; Texas Instruments; design for testability; test pattern generation; Clocks; Coherence; Flip-flops; Floating-point arithmetic; Logic design; Microprocessors; Pipelines; Prefetching; Registers; Testing;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470625
