• DocumentCode
    1826039
  • Title

    Fast nonlocal filtering applied to electron cryomicroscopy

  • Author

    Darbon, JérÔme ; Cunha, Alexandre ; Chan, Tony F. ; Osher, Stanley ; Jensen, Grant J.

  • Author_Institution
    Dept. of Math., California Univ., Los Angeles, CA
  • fYear
    2008
  • fDate
    14-17 May 2008
  • Firstpage
    1331
  • Lastpage
    1334
  • Abstract
    We present an efficient algorithm for nonlocal image filtering with applications in electron cryomicroscopy. Our denoising algorithm is a rewriting of the recently proposed nonlocal mean filter. It builds on the separable property of neighborhood filtering to offer a fast parallel and vectorized implementation in contemporary shared memory computer architectures while reducing the theoretical computational complexity of the original filter. In practice, our approach is much faster than a serial, non-vectorized implementation and it scales linearly with image size. We demonstrate its efficiency in data sets from Caulobacter crescentus tomograms and a cryoimage containing viruses and provide visual evidences attesting the remarkable quality of the nonlocal means scheme in the context of cryoimaging. With such development we provide biologists with an attractive filtering tool to facilitate their scientific discoveries.
  • Keywords
    biological techniques; biology computing; electron microscopy; filters; image denoising; Caulobacter crescentus tomograms; cryoimage; denoising algorithm; electron cryomicroscopy; fast nonlocal filtering; nonlocal image filtering; nonlocal mean filter; shared memory computer architecture; Biology computing; Charge coupled devices; Charge-coupled image sensors; Electron beams; Filtering; Filters; Image generation; Image reconstruction; Image resolution; Noise reduction; Nonlocal mean filtering; SIMD; electron cryomicroscopy; image denoising; image vectorization; parallel image processing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-2002-5
  • Electronic_ISBN
    978-1-4244-2003-2
  • Type

    conf

  • DOI
    10.1109/ISBI.2008.4541250
  • Filename
    4541250