DocumentCode
1826054
Title
Beam test of a large area n-on-n silicon strip detector with fast binary readout electronics
Author
Unno, Y. ; Kehriki, T. ; Terada, S. ; Iwasaki, H. ; Kondo, T. ; Nakao, M. ; Tamura, N. ; Fujita, K. ; Handa, T. ; Iwata, Y. ; Ohsugi, T. ; Dane, J. ; Pier, S. ; Ciocio, A. ; Emes, J. ; Gilchriese, M. ; Haber, C. ; Holland, S. ; Kipnis, I. ; Lozano-Bahile,
Author_Institution
Okayama Univ., Japan
Volume
1
fYear
1996
fDate
2-9 Nov 1996
Firstpage
573
Abstract
A large area (60 mm×60 mm) n-bulk and n-strip readout silicon strip detector was prototyped for the ATLAS SCT detector. Detector modules of 12 cm strip length were made by butting two detectors. One of the 12 cm modules was irradiated with protons to a fluence of 1.2×1014 p/cm2. A beam test was carried out for the non-irradiated and the irradiated detector modules. Efficiency, noise occupancy and performance in the edge regions were analyzed using the beam test data. High efficiency was obtained for the non-irradiated detector and for the irradiated detector for bias voltages down to about half the full depletion voltage. The noise occupancy was <2×10-4 for the 12 cm strips. The measurement of the edge region exhibited a difference in the sensitivity under the bias resistance where no extension of the n+-implant was fabricated
Keywords
detector circuits; nuclear electronics; proton detection; semiconductor device noise; silicon radiation detectors; ATLAS SCT detector; Si; edge region; fast binary readout electronics; full depletion voltage; irradiated detector modules; large area n-on-n silicon strip detector; noise occupancy; protons; Detectors; Electronic equipment testing; Manufacturing processes; P-n junctions; Prototypes; Readout electronics; Semiconductor device noise; Silicon; Strips; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
0-7803-3534-1
Type
conf
DOI
10.1109/NSSMIC.1996.591064
Filename
591064
Link To Document