Title :
Measurement based compact thermal model creation - accurate approach to neglect inaccurate TIM conductivity data
Author :
Vass-Varnai, Andras ; Bornoff, Robin ; Sarkany, Zoltan ; Ress, Sandor ; Rencz, Marta
Author_Institution :
Mech. Anal. Div., Mentor Graphics Corp., Mentor, OH, USA
Abstract :
In this paper two possible ways are investigated to create accurate thermal models without having validated information on the thermal properties of the applied thermal interface materials. One way is the calibration of a detailed numerical thermal model based on the physical information which can be derived from experimental structure functions. In the paper we show a complete calibration procedure using a TO-220 package as an example. Another approach is the generation of dynamic compact models based on real measurements. In order to apply this approach one has to identify the junction-to-case thermal resistance of the tested package using the JEDEC JESD 51-14 standard.
Keywords :
packaging; thermal resistance; JEDEC JESD 51-14 standard; TO-220 package; dynamic compact models; inaccurate TIM conductivity data neglection; junction-to-case thermal resistance; measurement based compact thermal model creation; numerical thermal model; thermal interface materials; Electronic packaging thermal management; Heating; Numerical models; Semiconductor device measurement; Temperature measurement; Thermal resistance;
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1983-7
Electronic_ISBN :
978-1-4577-1981-3
DOI :
10.1109/EPTC.2011.6184388