Title :
FFT based troubleshooting of 120 dB dynamic range ADC systems
Author :
Ownby, David ; Bogard, Harold
Author_Institution :
Crystal Semicond. Corp., Austin, TX, USA
Abstract :
A production test solution for a family of monolithic 120 dB dynamic range delta-sigma ADCs demands strict adherence to system noise reduction techniques. Analysis of the FFT plot of an ADC output can help identify sources of noise in a system. This paper discusses several common causes of noise in delta-sigma based ADC systems and presents FFT plots showing the effect on the ADC output. Armed with the knowledge of how noise can creep into a delta-sigma based ADC system and a repertoire of typical signatures in the FFT plot, the system designer can diagnose and eliminate much of the noise
Keywords :
analogue-digital conversion; fast Fourier transforms; fault diagnosis; integrated circuit testing; monolithic integrated circuits; production testing; sigma-delta modulation; 120 dB; ADC; FFT; clock jitter; delta-sigma; noise reduction; production test; signatures; troubleshooting; voltage reference; Bandwidth; Coupling circuits; Digital filters; Digital modulation; Dynamic range; Frequency; Noise reduction; Production systems; Semiconductor device noise; System testing;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470634
