Title :
Built-in current sensor for IDDQ test in CMOS
Author :
Hsue, Ching-Wen ; Lin, Chih-Jen
Author_Institution :
AT&T Bell Lab., Princeton, NJ, USA
Abstract :
This paper presents a current sensor circuit which can be built into a CMOS logic circuit to perform a self test for leakage current. The distinct features of the current sensor circuitry are described in detail. The circuit is verified by using the SPICE2 simulator
Keywords :
CMOS logic circuits; SPICE; built-in self test; electric current measurement; electric sensing devices; fault diagnosis; leakage currents; logic testing; CMOS logic circuit; IDDQ test; SPICE2 simulator; current sensor circuit; leakage current; self test; Analog circuits; CMOS digital integrated circuits; CMOS logic circuits; Circuit faults; Circuit testing; Leakage current; Logic devices; Logic gates; Logic testing; Sensor phenomena and characterization;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470640
