• DocumentCode
    1826314
  • Title

    Built-in current sensor for IDDQ test in CMOS

  • Author

    Hsue, Ching-Wen ; Lin, Chih-Jen

  • Author_Institution
    AT&T Bell Lab., Princeton, NJ, USA
  • fYear
    1993
  • fDate
    17-21 Oct 1993
  • Firstpage
    635
  • Lastpage
    641
  • Abstract
    This paper presents a current sensor circuit which can be built into a CMOS logic circuit to perform a self test for leakage current. The distinct features of the current sensor circuitry are described in detail. The circuit is verified by using the SPICE2 simulator
  • Keywords
    CMOS logic circuits; SPICE; built-in self test; electric current measurement; electric sensing devices; fault diagnosis; leakage currents; logic testing; CMOS logic circuit; IDDQ test; SPICE2 simulator; current sensor circuit; leakage current; self test; Analog circuits; CMOS digital integrated circuits; CMOS logic circuits; Circuit faults; Circuit testing; Leakage current; Logic devices; Logic gates; Logic testing; Sensor phenomena and characterization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1993. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    0-7803-1430-1
  • Type

    conf

  • DOI
    10.1109/TEST.1993.470640
  • Filename
    470640
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1826314