DocumentCode
1826322
Title
Automated lateral sectioning for Knife-Edge Scanning Microscopy
Author
Kwon, J. ; Mayerich, D. ; Choe, Y. ; McCormick, B.H.
Author_Institution
Dept. of Comput. Sci., Texas A&M Univ., College Station, TX
fYear
2008
fDate
14-17 May 2008
Firstpage
1371
Lastpage
1374
Abstract
Recent advances in high-throughput microscopy are used to acquire large-scale anatomical information at the microscopic level. One of these methods, known as knife-edge scanning microscopy (KESM), allows large volumes of tissue to be imaged using physical sectioning. This method has been limited, however, by constraints on the field of view of the objective and the need to prevent damage to tissue before it is imaged. In this paper, we describe a simple sectioning algorithm we use to overcome these constraints on tissue size. By maintaining a height field of the tissue surface, we are able to cut lateral sections while minimizing damage to un-imaged tissue. Although lateral sectioning introduces some deformation and tissue damage at the interface of the sections, the damage is minimal and the deformations can be compensated for using affine transformations.
Keywords
affine transforms; biological tissues; biomechanics; biomedical optical imaging; medical image processing; optical information processing; optical microscopy; affine transformations; automated lateral sectioning; high-throughput microscopy; knife-edge scanning microscopy; large-scale anatomical information; optical technology; physical sectioning; tissue damage; tissue deformation; tissue surface; Cameras; Computer science; Electron microscopy; Electron optics; High speed optical techniques; High-resolution imaging; Large-scale systems; Optical imaging; Optical microscopy; Tissue damage; KESM; knife-edge scanning microscopy; microscopy; serial sectioning;
fLanguage
English
Publisher
ieee
Conference_Titel
Biomedical Imaging: From Nano to Macro, 2008. ISBI 2008. 5th IEEE International Symposium on
Conference_Location
Paris
Print_ISBN
978-1-4244-2002-5
Electronic_ISBN
978-1-4244-2003-2
Type
conf
DOI
10.1109/ISBI.2008.4541260
Filename
4541260
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