Title :
IDD pulse response testing on analog and digital CMOS circuits
Author :
Beasley, J.S. ; Ramamurthy, H. ; Ramirez-Angulo, J. ; DeYong, M.
Author_Institution :
New Mexico State Univ., Las Cruces, NM, USA
Abstract :
This paper presents a new method for detecting defect and fabrication variations in both digital and analog CMOS circuits by simultaneously pulsing the power supply rails and analyzing the temporal and/or the spectral characteristics of the resulting transient rail currents. The method presented has a distinct advantage over other forms of iDD testing because it requires a single test vector to excite and expose the presence of a defect or irregular fabrication process condition. This paper presents data from simulations and defective IC´s supporting this technique
Keywords :
CMOS analogue integrated circuits; CMOS digital integrated circuits; electric current measurement; impulse testing; integrated circuit testing; spectral analysis; IDD pulse response testing; analog CMOS circuits; digital CMOS circuits; power supply rails; simulations; single test vector; spectral characteristics; temporal characteristics; transient rail currents; CMOS analog integrated circuits; CMOS digital integrated circuits; Circuit testing; Fabrication; Power supplies; Pulse circuits; Pulsed power supplies; Rails; Transient analysis; Voltage;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470641
