DocumentCode
1826409
Title
Quality and single-stuck faults
Author
McCluskey, E.J.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Stanford Univ., CA, USA
fYear
1993
fDate
17-21 Oct 1993
Firstpage
597
Abstract
The goal of IC production test is to avoid selling bad parts. The goal of fault grading is to assure that the test is so thorough that only an acceptably small fraction of shipped parts are bad. Fault grading is almost always based on a single-stuck fault, ssf, model
Keywords
integrated circuit testing; integrated logic circuits; logic testing; production testing; quality control; IC production test; fault grading; quality assurance; single-stuck faults; Circuit faults; Circuit testing; Delay; Fault detection; Integrated circuit interconnections; Integrated circuit testing; Inverters; Laboratories; Production; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1993. Proceedings., International
Conference_Location
Baltimore, MD
Print_ISBN
0-7803-1430-1
Type
conf
DOI
10.1109/TEST.1993.470645
Filename
470645
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