Abstract :
The need for design for testability (DFT) in mixed-signal boards and systems is becoming more significant as the miniaturization and superintegration trends continue. Accessibility to critical nodes of the circuits is required in order to meet the demands for higher quality, lower cost, shorter time to market, continuous improvement and standardization. However, we must be prudent in the way we address these demands, especially during the development of the P1149.4 Mixed-Signal Standard, in order to insure the appropriate balance
