• DocumentCode
    1826560
  • Title

    Integrating electrical test into final assembly

  • Author

    Littlebury, Hugh ; Brueckner, Roger

  • Author_Institution
    Motorola Logic & Analog Technol. Group, Tempe, AZ, USA
  • fYear
    1993
  • fDate
    17-21 Oct 1993
  • Firstpage
    585
  • Lastpage
    589
  • Abstract
    This paper describes a set of projects that combine integrated circuit assembly steps. The completed set of projects will allow direct shipment of devices to customers from the end of the trim and form press. The integrated process steps include strip inspection, device mark, mark inspection, dambar removal, lead trim, final test, device form, device singulation, coplanarity inspection, reject sort and final package. The core change in assembly philosophy is to eliminate final test as a separate process step by performing the final test function earlier in the product flow
  • Keywords
    electronic equipment testing; inspection; packaging; process control; production testing; coplanarity inspection; device mark; electrical test; final package; final test; integrated circuit assembly; lead trim; mark inspection; reject sort; singulation; strip inspection; Assembly; Circuit testing; Curing; Ink; Inspection; Integrated circuit packaging; Lead; Pins; Wafer bonding; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1993. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    0-7803-1430-1
  • Type

    conf

  • DOI
    10.1109/TEST.1993.470651
  • Filename
    470651