• DocumentCode
    1826640
  • Title

    Characterization of edge placement accuracy in high-speed digital pin electronics

  • Author

    Creek, Will

  • Author_Institution
    LTX Corp., San Jose, CA, USA
  • fYear
    1993
  • fDate
    17-21 Oct 1993
  • Firstpage
    556
  • Lastpage
    565
  • Abstract
    Understanding and measuring edge placement accuracy in pin electronics designs can be a tricky and misleading process. This is especially true when the timing differences being measured are on the order of 25 ps. This paper describes some of the potential error sources in pin electronics designs and briefly explains the causes. It then describes the test methods that were used to evaluate the edge placement accuracy of a new pin electronics design for a family of high-speed digital test systems, and discusses how the techniques were carried forward to provide extremely accurate AC testing in a production environment
  • Keywords
    VLSI; comparators (circuits); driver circuits; integrated circuit testing; production testing; AC testing; comparator; driver; edge placement accuracy; error sources; high-speed digital pin electronics; high-speed digital test systems; production environment; timing differences; Accuracy; Circuit testing; Clamps; Driver circuits; Electronic equipment testing; Switches; Switching circuits; System testing; Timing; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1993. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • Print_ISBN
    0-7803-1430-1
  • Type

    conf

  • DOI
    10.1109/TEST.1993.470654
  • Filename
    470654