Title :
Position Control using 2D-to-2D Feature Correspondences in Vision Guided Cell Micromanipulation
Author :
Yanliang Zhang ; Mingli Han ; Cheng Yap Shee ; Wei Tech Ang
Author_Institution :
Nanyang Technol. Univ. (NTU), Singapore
Abstract :
Conventional camera calibration that utilizes the extrinsic and intrinsic parameters of the camera and the objects has certain limitations for micro-level cell operations due to the presence of hardware deviations and external disturbances during the experimental process, thereby invalidating the extrinsic parameters. This invalidation is often neglected in macro-world visual servoing and affects the visual image processing quality, causing deviation from the desired position in micro-level cell operations. To increase the success rate of vision guided biological micromanipulations, a novel algorithm monitoring the changing image pattern of the manipulators including the injection micropipette and cell holder is designed and implemented based on 2 dimensional (2D)-to 2D feature correspondences and can adjust the manipulator and perform position control simultaneously. When any deviation is found, the manipulator is retracted to the initial focusing plane before continuing the operation.
Keywords :
bioMEMS; biological techniques; cellular biophysics; micromanipulators; position control; 2D-to-2D feature correspondences; cell holder; image pattern; injection micropipette; macroworld visual servoing; microlevel cell operations; position control; vision guided cell micromanipulation; visual image processing quality; Algorithm design and analysis; Calibration; Cameras; Cells (biology); Focusing; Hardware; Image processing; Monitoring; Position control; Visual servoing; Algorithms; Artificial Intelligence; Cell Culture Techniques; Cells, Cultured; Feedback; Flow Cytometry; Image Interpretation, Computer-Assisted; Micromanipulation; Pattern Recognition, Automated; Robotics;
Conference_Titel :
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location :
Lyon
Print_ISBN :
978-1-4244-0787-3
DOI :
10.1109/IEMBS.2007.4352573