DocumentCode
1826972
Title
Keep alive-A new requirement for high performance μprocessor test
Author
Garcia, Rudy
Author_Institution
Schlumberter Technol., San Jose, CA, USA
fYear
1993
fDate
17-21 Oct 1993
Firstpage
446
Lastpage
450
Abstract
The latest generation of RISC μprocessor devices cannot remain powered up without simultaneously being stimulated by the test system, or they will enter into a catastrophic high power dissipation mode. This paper presents a novel solution to this new testing problem
Keywords
automatic testing; computer testing; integrated circuit testing; microprocessor chips; pipeline processing; reduced instruction set computing; CMOS; RISC microprocessor; asynchronous clock timing generator; catastrophic high power dissipation; continuous vector repeat; keep alive testing; superpipelined RISC; CMOS process; Circuit testing; Clocks; Drives; Electronics packaging; Performance evaluation; Power dissipation; Power generation; Reduced instruction set computing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1993. Proceedings., International
Conference_Location
Baltimore, MD
Print_ISBN
0-7803-1430-1
Type
conf
DOI
10.1109/TEST.1993.470667
Filename
470667
Link To Document