Title :
Keep alive-A new requirement for high performance μprocessor test
Author_Institution :
Schlumberter Technol., San Jose, CA, USA
Abstract :
The latest generation of RISC μprocessor devices cannot remain powered up without simultaneously being stimulated by the test system, or they will enter into a catastrophic high power dissipation mode. This paper presents a novel solution to this new testing problem
Keywords :
automatic testing; computer testing; integrated circuit testing; microprocessor chips; pipeline processing; reduced instruction set computing; CMOS; RISC microprocessor; asynchronous clock timing generator; catastrophic high power dissipation; continuous vector repeat; keep alive testing; superpipelined RISC; CMOS process; Circuit testing; Clocks; Drives; Electronics packaging; Performance evaluation; Power dissipation; Power generation; Reduced instruction set computing; System testing;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470667
