DocumentCode :
1827046
Title :
New method for comprehensive characterisation of MESFET, MOSFET, MODFET´s
Author :
Parker, Anthony E. ; Scott, J.B.
Author_Institution :
Macquarie University
fYear :
1993
fDate :
3-6 May 1993
Firstpage :
1093
Lastpage :
1096
Keywords :
FETs; HEMTs; MESFETs; MODFETs; MOSFET circuits; Measurement techniques; Predictive models; Pulse measurements; Scattering parameters; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Conference_Location :
IEEE
Print_ISBN :
0-7803-1281-3
Type :
conf
Filename :
692839
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1827046
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