IEEE 1149 standards - Changing testing, silicon to systems

Author

Tulloss, Rodham E.

Author_Institution

AT&T Bell Lab., Princeton, NJ, USA

fYear

1993

fDate

17-21 Oct 1993

Firstpage

399

Lastpage

408

Abstract

After an introduction to IEEE standards development, the five active standards projects in the IEEE 1149 family are described briefly. Some just promulgated changes to ANSI/IEEE Std 1149.1 are presented. Among these changes are two new optional instructions intended to aid testing of product which require both in-circuit and boundary-scan testing and subordination of the 1149.1 Test Access Port to higher level test control. Updates on the status of IEEE P1149.2 and IEEE P1149.5 are presented

Keywords

IEEE standards; automatic testing; boundary scan testing; design for testability; integrated circuit testing; production testing; ANSI/IEEE Std 1149.1; IEEE 1149 standards; IEEE P1149.2; IEEE P1149.5; active standards projects; boundary-scan testing; in-circuit testing; production testing; subordination; Digital signal processors; Digital systems; Manufacturing processes; Microprocessors; Proposals; Signal design; Silicon; Standardization; Standards development; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1993. Proceedings., International

Conference_Location

Baltimore, MD

Print_ISBN

0-7803-1430-1

Type

conf

DOI

10.1109/TEST.1993.470672

Filename

470672

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1827081