DocumentCode
1827243
Title
Green mould compounds: Impact on second level interconnect reliability
Author
Vandevelde, B. ; Lofrano, M. ; Willems, G.
Author_Institution
Imec, Leuven, Belgium
fYear
2011
fDate
7-9 Dec. 2011
Firstpage
283
Lastpage
288
Abstract
The change-over from conventional to so-called green moulding compounds has gradually taken place in the last five years. These green mould compound materials have a lower thermal expansion and higher elastic modulus. As a consequence of the modified thermal and mechanical properties, an impact on the thermo-mechanical behaviour of the package-board assembly is expected (so-called Package Board Interaction: PBI). The CTE difference between the package and the board increases introducing the green mould compounds. This paper discusses the impact of the use of green moulding compounds to the second level solder joint fatigue cracking. The comparison with non-green mould compounds used in the past is done by experiments for TSOP´s and by finite element modelling studies for a wide range of packages. The study reveals that the impact of the transition to green mould compound is substantial and can lead to early solder joint fatigue failures in applications. The paper also shows that tests on flexible PCB´s underestimate the impact. In particular for assembly on rigid boards the mean life time may reduce to 20% of the life time obtained for non-green moulded packages.
Keywords
fatigue cracks; finite element analysis; integrated circuit interconnections; integrated circuit reliability; moulding; printed circuits; solders; PCB; elastic modulus; fatigue failures; finite element modelling; green moulding compounds; mechanical properties; package board interaction; package-board assembly; second level interconnect reliability; solder joint fatigue cracking; thermal expansion; thermal properties; thermo-mechanical behaviour; Compounds; Copper; Fatigue; Green products; Soldering; Strain;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
Conference_Location
Singapore
Print_ISBN
978-1-4577-1983-7
Electronic_ISBN
978-1-4577-1981-3
Type
conf
DOI
10.1109/EPTC.2011.6184432
Filename
6184432
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