DocumentCode
1827254
Title
An ALU-based programmable MISR/pseudorandom generator for a MC68HC11 family self-test
Author
Broseghini, James ; Lenhert, Donald H.
Author_Institution
Motorola, Inc., Austin, TX, USA
fYear
1993
fDate
17-21 Oct 1993
Firstpage
349
Lastpage
358
Abstract
This paper describes an ALU-based self-test system implemented on a MC68HC11 Family microcontroller. A fully programmable pseudorandom pattern generator and multiple input signature register are used to reduce test lengths and aliasing probabilities. Design constraints and goals are described along with a detailed description of an efficient method of using the ALU to implement the self-test functions. Systems usage and burn-in applications are also described
Keywords
automatic test equipment; automatic testing; built-in self test; logic testing; microcontrollers; MC68HC11; aliasing probabilities; arithmetic logic unit; burn-in applications; microcontroller; multiple input signature register; programmable MISR/pseudorandom generator; pseudorandom pattern generator; self-test system; Built-in self-test; Central Processing Unit; Concurrent engineering; Microcontrollers; Microprocessors; Probes; Production; Registers; Silicon; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1993. Proceedings., International
Conference_Location
Baltimore, MD
Print_ISBN
0-7803-1430-1
Type
conf
DOI
10.1109/TEST.1993.470678
Filename
470678
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