DocumentCode
1827302
Title
Structured CBIST in ASICS
Author
Gage, Robert
Author_Institution
Sequent Comput. Syst., Beaverton, OR, USA
fYear
1993
fDate
17-21 Oct 1993
Firstpage
332
Lastpage
338
Abstract
A novel method for automating the installation of CBIST and moving test development forward in the design cycle is shown, including a practical method for determining CBIST pathology. Three ASICS have been developed with this method. Design and prototype results are given
Keywords
application specific integrated circuits; automatic test equipment; built-in self test; design for testability; logic testing; ASIC; ATE; CBIST; circular BIST; design; pathology checker; Application specific integrated circuits; Automatic testing; Circuit faults; Circuit testing; Hardware design languages; Logic testing; Pathology; Registers; Runtime; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1993. Proceedings., International
Conference_Location
Baltimore, MD
Print_ISBN
0-7803-1430-1
Type
conf
DOI
10.1109/TEST.1993.470680
Filename
470680
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