• DocumentCode
    1827461
  • Title

    Development for VCI (Vertical Circuit Interconnection) technology for stacked die package

  • Author

    Chang, Ivan ; Tsai, Jensen ; Chiang, James ; Liu, Daniel ; Tsai, FL ; Shih, Daniel ; Tung, Edward

  • Author_Institution
    Siliconware Precision Ind. Co., Ltd., Taichung, Taiwan
  • fYear
    2011
  • fDate
    7-9 Dec. 2011
  • Firstpage
    333
  • Lastpage
    335
  • Abstract
    Wire bonding technology has been the mainstream for stacked die packages for over five years. Yet, based on current design rule, the package body size increases with respect to the number of dice stacked in the package. Furthermore, the electrical performance is greatly dependant to the wire length. By applying Vertical Circuit Interconnection technology, VCI, the package footprint can be reduced to offer relatively smaller package size. As such, the electrical performance is enhanced due to shorter signal transmitting length. The concept of VCI technology is to replace wire bond by conductive glue, which vertically connects electric pads from strum to strum inside the die stack. Besides the standard assembly process flow, such as die attach, molding, singulation, three new process stages - parylene coating, laser ablation and conductive glue dispensing, are introduced to replace wire bonding after die attach process. Two test vehicles, tier stack and pyramid stack structure, were discussed in the report. Open/short test and reliability performance were examined post assembly. The packages delivered by VCI technology can be an alternative choice in small package as it offers competitive cost and performance to those by WB technology.
  • Keywords
    laser ablation; lead bonding; moulding; conductive glue dispensing; die attach process; die stack; electric pads; laser ablation; molding; package footprint; parylene coating; pyramid stack structure; reliability performance; signal transmitting length; singulation; stacked die package; tier stack; vertical circuit interconnection technology; wire bonding technology; wire length; Bonding; Coatings; Fingers; Integrated circuit interconnections; Laser ablation; Substrates; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4577-1983-7
  • Electronic_ISBN
    978-1-4577-1981-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2011.6184440
  • Filename
    6184440