DocumentCode
1827509
Title
Theoretical and experimental analysis of electron beam irradiated polymers
Author
Chinaglia, D.L. ; Figueiredo, M.T. ; Santos, L.F. ; Ferreira, G. F Leal ; Faria, R.M.
Author_Institution
Dept. de Fisica, UNESP, Rio Claro, Brazil
fYear
1999
fDate
1999
Firstpage
119
Lastpage
122
Abstract
Charge transport and storage phenomena were analyzed in Teflon FEP, polyethylene (PE), and poly(vinylidene fluoride) (PVDF) foils irradiated with partially penetrating electron beams, in a Split Faraday Cup (SFC) arrangement. Measurements of electrical current were performed during the electron irradiation. The irradiated front electrode was grounded while the rear electrode was positively biased. The experimental results were fitted by models which considered two different media: the irradiated region (I) and the non-irradiated one (NI). In the later, NI-region, the intrinsic electrical properties of the material were considered. In the I-region, on the other hand, effects of irradiation, as carrier generation, recombination effect and trapping-detrapping phenomenon play a fundamental role in the transport process. Beside the explanation of the experimental behavior observed in each material, the theoretical treatment provided important electrical parameters
Keywords
electrets; electrical conductivity; electron beam effects; electron traps; electron-hole recombination; foils; polymer films; PVDF foils; Split Faraday Cup; Teflon FEP; carrier generation; charge transport; electrical current; electron beam irradiated polymers; intrinsic electrical properties; poly(vinylidene fluoride); polyethylene; recombination; storage phenomena; transport process; trapping-detrapping phenomenon; Current measurement; Dielectric materials; Electric variables measurement; Electrodes; Electron beams; Electron traps; Performance evaluation; Polyethylene; Polymer films; Spontaneous emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrets, 1999. ISE 10. Proceedings. 10th International Symposium on
Conference_Location
Athens
Print_ISBN
0-7803-5025-1
Type
conf
DOI
10.1109/ISE.1999.831959
Filename
831959
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