DocumentCode
1827623
Title
Benefits of boundary-scan to in-circuit test
Author
Greene, David A.
Author_Institution
NCR Corp., West Columbia, SC, USA
fYear
1993
fDate
17-21 Oct 1993
Firstpage
263
Abstract
Boundary-Scan 1149.1 and its tight coupling with built-in self test (BIST) has proven to be an integral part in the time-to-market (TTM) and customer satisfaction that NCR computers are experiencing in their product realization cycles. As one of the many benefactors of these designed-in test features, the manufacturing test group within Columbia has realized tremendous increases in efficiencies in delivering tested modules, especially prototypes, to the respective design centers
Keywords
application specific integrated circuits; boundary scan testing; built-in self test; printed circuit testing; ASIC; BIST; Boundary-Scan 1149.1; Columbia; NCR computers; in-circuit test; prototypes; Assembly; Built-in self-test; Circuit faults; Circuit testing; Hardware; Manufacturing processes; Packaging; Pins; Prototypes; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1993. Proceedings., International
Conference_Location
Baltimore, MD
Print_ISBN
0-7803-1430-1
Type
conf
DOI
10.1109/TEST.1993.470694
Filename
470694
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