Title :
Benefits of boundary-scan to in-circuit test
Author :
Greene, David A.
Author_Institution :
NCR Corp., West Columbia, SC, USA
Abstract :
Boundary-Scan 1149.1 and its tight coupling with built-in self test (BIST) has proven to be an integral part in the time-to-market (TTM) and customer satisfaction that NCR computers are experiencing in their product realization cycles. As one of the many benefactors of these designed-in test features, the manufacturing test group within Columbia has realized tremendous increases in efficiencies in delivering tested modules, especially prototypes, to the respective design centers
Keywords :
application specific integrated circuits; boundary scan testing; built-in self test; printed circuit testing; ASIC; BIST; Boundary-Scan 1149.1; Columbia; NCR computers; in-circuit test; prototypes; Assembly; Built-in self-test; Circuit faults; Circuit testing; Hardware; Manufacturing processes; Packaging; Pins; Prototypes; System testing;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470694
