• DocumentCode
    1827702
  • Title

    Build-up electrical insulation material with low-dielectric loss tangent, low-CTE and low-surface roughness

  • Author

    Horiki, Eita ; Suzuki, Isao ; Tanaka, Toshiaki ; Uenishi, Akihiro ; Shiomi, Kazuyoshi

  • Author_Institution
    IM Project, Sekisui Chem. Co., Ltd., Tsukuba, Japan
  • fYear
    2011
  • fDate
    7-9 Dec. 2011
  • Firstpage
    363
  • Lastpage
    368
  • Abstract
    With the increasing speed of information and communication equipment in recent years, together with the high-speed signal processing of LSIs, there is a requirement for build-up electrical insulation materials (used in IC package substrates) to have low-dielectric loss tangent which reduces dielectric loss so as to achieve low transmission loss in the high-frequency GHz bands. At the same time, there is an increasing need for materials to have low-CTEs (Coefficient of Thermal Expansion) so as to ensure highly reliable substrates. With our formulation technology, we have developed a next-generation film-shaped build-up electrical insulation material compatible with high-frequency signal transmission by using a composition of practical thermosetting epoxy resin, which has realized both a low-dielectric loss tangent and at the same time, a low-CTE. In addition, this material can show a low-surface roughness after the film desmear process. It is thus expected to help reduce not only dielectric loss by means of a low- dielectric loss tangent, but also conductor loss caused by the skin effect, and will promote fine line formation by means of SAP (Semi Additive Process).
  • Keywords
    dielectric losses; insulation; integrated circuit packaging; resins; thermal expansion; IC package substrate; LSI; SAP; electrical insulation material; film desmear process; high-frequency signal transmission; high-speed signal processing; low-CTE; low-dielectric loss tangent; low-surface roughness; semiadditive process; skin effect; thermal expansion coefficient; thermosetting epoxy resin; transmission loss; Copper; Dielectric losses; Insulation; Materials; Propagation losses; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4577-1983-7
  • Electronic_ISBN
    978-1-4577-1981-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2011.6184447
  • Filename
    6184447