DocumentCode
1827751
Title
CZT strip detectors for imaging and spectroscopy: collimated beam and ASIC readout experiments
Author
Kurczynski, P. ; Krizmanic, J.F. ; Stahle, C.M. ; Parsons, A. ; Palmer, D.M. ; Bartlett, L.M. ; Barthelmy, S.D. ; Birsa, F. ; Gehrels, N. ; Odom, J. ; Hanchak, C. ; Shu, P. ; Teegarden, B.J. ; Tueller, J. ; Barbier, L.M.
Author_Institution
Dept. of Phys., Maryland Univ., College Park, MD, USA
Volume
1
fYear
1996
fDate
2-9 Nov 1996
Firstpage
670
Abstract
We report the status of ongoing investigations into Cadmium Zinc Telluride (CZT) strip detectors for application in hard X-ray astronomy. We have instrumented a nine strip by nine strip region of a two sided strip detector made in our detector fabrication facility. In order to measure the position resolution of our detectors, we have implemented a collimated beam that concentrates radiation to a spot size less than the strip width of our detector. We have also performed charge collection studies as a function of incident photon energy and bias voltage with a single sided, 100 μm pitch CZT strip detector wire bonded to an SVX ASIC charge amplifier. The detectors exhibited excellent strip uniformity in terms of photon count rate and spectroscopic information
Keywords
X-ray astronomy; X-ray detection; X-ray spectrometers; amplifiers; application specific integrated circuits; astronomical instruments; detector circuits; nuclear electronics; position sensitive particle detectors; semiconductor counters; 100 mum; ASIC readout experiments; CZT strip detectors; CdZnTe; SVX ASIC charge amplifier; charge collection studies; collimated beam experiments; hard X-ray astronomy; imaging; photon count rate; spectroscopic information; spectroscopy; strip uniformity; two sided strip detector; Cadmium compounds; Collimators; Optical imaging; Radiation detectors; Spectroscopy; Strips; X-ray detection; X-ray detectors; X-ray imaging; Zinc compounds;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
Conference_Location
Anaheim, CA
ISSN
1082-3654
Print_ISBN
0-7803-3534-1
Type
conf
DOI
10.1109/NSSMIC.1996.591088
Filename
591088
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