Title :
An intelligent voltage controller for static VAr compensators
Author :
Sharaf, A.M. ; Snider, L.A.
Author_Institution :
New Brunswick Univ., Fredericton, NB, Canada
Abstract :
The paper presents a novel AI-rule based intelligent controller for a fixed capacitor-thyristor controlled reactor (FC-TCR) static VAr compensator (SVC). The intelligent voltage regulator is based on the concept of the error excursion plane where the stabilizing action is scaled by the magnitude of the excursion voltage error vector, in order to ensure adequate compensation. The proposed rule based voltage regulator is validated using ATP/EMTP and is compared with an optimized conventional proportional plus integral voltage controller. The proposed rule based design is robust and tolerates system parameter variations as well as modelling inaccuracies, since the control level is only scaled by the location of the voltage excursion error vector in the (ev -e˙v) error plane. The scheme is validated for two large system contingencies comprising load rejection and a three phase short circuit fault followed by loss of a transmission line
Keywords :
artificial intelligence; compensation; intelligent control; knowledge based systems; power control; power system computer control; reactive power; reactors (electric); short-circuit currents; static VAr compensators; thyristor applications; voltage control; voltage regulators; AI-rule based intelligent controller; ATP/EMTP; compensation; error excursion plane; excursion voltage error vector; fixed capacitor-thyristor controlled reactor; intelligent voltage controller; load rejection; proportional plus integral voltage controller; stabilizing action; static VAr compensators; three phase short circuit fault; transmission line loss; Circuits; EMTP; Error correction; Inductors; Pi control; Proportional control; Regulators; Robust control; Static VAr compensators; Voltage control;
Conference_Titel :
System Theory, 1994., Proceedings of the 26th Southeastern Symposium on
Conference_Location :
Athens, OH
Print_ISBN :
0-8186-5320-5
DOI :
10.1109/SSST.1994.287876